28C256T EEPROM, 256K (32k x 8-bit)				28C256T Information - Product Datasheet - Radiation Reports - Product Flow - Back to Memory

Features

• RAD-PAK® radiation-hardened against natural space radiation
• Total dose hardness:
  • > 100 Krad (Si), dependent upon space mission
• Excellent Single Event Effects:
  • SELTH LET: > 120 MeV/mg/cm²
  • SEUTH LET (read mode): > 90 MeV/mg/cm²
  • SEUTH LET (write mode): > 18 MeV/mg/cm²
• Package:
  • 28 pin RAD-PAK® flat pack
  • 28 pin RAD-PAK® DIP
• JEDEC approved byte wide pinout
• High Speed:
  • 120, 150 ns maximum access times available
• High endurance:
  • 10,000 erase/write (in Page Mode), 10-year data retention
• Page Write Mode:
  • 1 to 64 bytes
• Low power dissipation:
  • 15 mA active current (cycle = 1 µs)
  • 20 µA standby current (CE = VCC)

Description

Maxwell Technologies’ 28C256T high density 256k-bit EEPROM microcircuit features a greater than 100 krad (Si) total dose tolerance, depending upon space mission. The 28C256T is capable of in-system electrical byte and page programmability. It has a 64-Byte page programming function to make its erase and write operations faster. It also features data polling to indicate the completion of erase and programming operations.

Maxwell Technologies' patented RAD-PAK® packaging technology incorporates radiation shielding in the microcircuit package. It eliminates the need for box shielding while providing the required radiation shielding for a lifetime in orbit or space mission. In a GEO orbit, RAD-PAK provides greater than 100 krad (Si) radiation dose tolerance. This product is available with screening up to Class S.