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Features
- Four 512k x 8 SRAM architecture
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RAD-PAK® technology hardens against natural space radiation
technology
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Total dose hardness:
- > 100 krad (Si), depending upon space mission
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Excellent Single Event Effects:
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SEL > 68 MeV/mg/cm2
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SEU threshold = 3 MeV/mg/cm2
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SEU saturated cross section: 6E-9 cm2/bit
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Package:
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Fast access time:
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Completely static memory - no clock or timing strobe
required
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Internal bypass capacitor
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High-speed silicon-gate CMOS technology
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5V or 3V ± 10% power supply
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Equal address and chip enable access times
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Three-state outputs
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All inputs and outputs are TTL compatible
Description
Maxwell Technologies’ 89C1632 high-performance 16 Megabit Multi-Chip Module (MCM) Static Random Access Memory features a greater than 100 krad (Si) total dose tolerance, depending upon space mission. The four 4-Megabyte SRAM die and bypass capacitors are incorporated into a high-reliable hermetic quad flat-pack ceramic package.
With high-performance silicon-gate CMOS technology, the 89C1632 reduces power consumption and eliminates the need for external clocks or timing strobes. It is equipped with output enable (OE) and four byte enable (CS1 - CS4) inputs to allow greater system flexibility. When OE input is high, the output is forced to high impedance.
Maxwell Technologies' patented RAD-PAK® packaging technology incorporates radiation shielding in the microcircuit package. In a GEO orbit, RAD-PAK provides true greater than 100 krad (Si) total radiation dose tolerance, dependent upon space mission. It eliminates the need for box shielding while providing the required radiation shielding for a lifetime in orbit or a space mission. This product is available in Class H or Class K packaging and screening.
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