28C256T EEPROM, 256K (32k x 8-bit)

• Excellent Single Event Effects:
  • SELTH LET: > 120 MeV/mg/cm2
  • SEUTH LET (read mode): > 90 MeV/mg/cm2
  • SEUTH LET (write mode): > 18 MeV/mg/cm2
• JEDEC approved byte wide pinout
• High Speed:
  • 120, 150 ns maximum access times available
• High endurance:
  • 10,000 erase/write (in Page Mode), 10-year data retention
• Page Write Mode:
  • 1 to 64 bytes

Maxwell Technologies’ 28C256T high density 256k-bit EEPROM microcircuit features a greater than 100 krad (Si) total dose tolerance, depending upon space mission. The 28C256T is capable of in-system electrical byte and page programmability. It has a 64-Byte page programming function to make its erase and write operations faster. It also features data polling to indicate the completion of erase and programming operations.

Specifications At A Glance
Package:	28 pin RAD-PAK® flat pack 28 pin RAD-PAK® DIP
RAD-PAK® radiation-hardened against natural space radiation
Low power dissipation:
	15 mA active current (cycle = 1 µs)
	20 µA standby current (CE = VCC
Total dose hardness:
	>100 krad (Si), depending upon space mission

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About RAD-PAK® Technology

Maxwell Technologies' patented RAD-PAK® packaging technology incorporates radiation shielding in the microcircuit package. It eliminates the need for box shielding while providing the required radiation shielding for a lifetime in orbit or space mission. In a GEO orbit, RAD-PAK provides greater than 100 krad (Si) radiation dose tolerance. This product is available with screening up to Class S.