28LV011 EEPROM, 3.3V 1 Megabit (128K x 8-Bit)
| Package(s) : |
|---|
| 32-Pin RAD-PAK® Flat Pack 32-Pin RAD-PAK® DIP |
| Memory Size: |
| 128k x 8 Bit |
| Voltage: |
| 3.3V low voltage |
| Access Time: |
| 200 or 250ns |
| Radiation Performance: |
|---|
| Total dose hardness >100 krad (Si), dependent upon space mission |
| SEL threshold > 84 MeV-cm2/mg |
| SEU threshold ~ 26 MeV-cm2/mg (Read Mode) |
| SEU saturated cross section ~ 3 x 10-6 cm2/device (Read Mode) |
| SEU threshold ~ 11 MeV-cm2/mg (Write Mode) |
| SEU saturated cross section ~ 6 x 10-3 cm2/device (Write Mode) |
Maxwell Technologies’ 28LV011 high density, 3.3V, 1 Megabit EEPROM microcircuit features a greater than 100 krad (Si) total dose tolerance, depending upon space mission. The 28LV011 is capable of in-system electrical Byte and Page programmability. It has a 128-Byte Page Programming function to make its erase and write operations faster. It also features Data Polling and a Ready/Busy signal to indicate the completion of erase and programming operations.
In the 28LV011, hardware data protection is provided with the RES pin, in addition to noise protection on the WE signal and write inhibit on power on and off. Meanwhile, software data protection is implemented using the JEDEC-optional Standard algorithm. The 28LV011 is designed for high reliability in the most demanding space applications.
About RAD-PAK® Technology
Maxwell Technologies' patented RAD-PAK® packaging technology incorporates radiation shielding in the microcircuit package. It eliminates the need for box shielding while providing the required radiation shielding for a lifetime in orbit or space mission. In a GEO orbit, RAD-PAK provides greater than 100 krad (Si) radiation dose tolerance. This product is available with screening up to Class S.
