Nuclear Event Detectors

Maxwell Technologies Microelectronics' Nuclear Event Detectors (NEDs) provide a simple, small, reliable, and convenient method for:

• detecting ionizing radiation pulses
• controlling hardware to prevent upset and permanent damage
• initiating both hardware and software recovery from the event
• providing all of these benefits, and more, in a package outline of less than 0.5” x 0.8”

The proper incorporation of this product into a circuit or system design provides a cost-effective means to achieve the required levels of nuclear hardness for the prompt ionizing radiation environment.

• prompt ionizing radiation detector,
• a monostable pulse generator,
• a bi-stable logic latch, and
• built-in test (BIT).

Four models of NEDs are available to suit a variety of different needs and levels of screening requirements.